Mohlo by sa vám tiež páčiť

Viac informácií o knihe Atomic Force Microscopy/Scanning Tunneling Microscopy 3

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 373 bodov

Anotácia knihy

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Parametre knihy

Zaradenie knihy Books in English Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Celý názov: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
• Autor: Samuel H. Cohen, Marcia L. Lightbody
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 210
• EAN: 9781475781847
• ISBN: 1475781849
• ID: 02254200
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 426 g
• Rozmery: 254 × 178 × 13 mm
• Dátum vydania: 22. May 2013

Obľúbené z iného súdka

---

---

---