Code: 01424507
Microelectronic Test Structures for CMOS Technology
by Manjul Bhushan, Mark B. Ketchen
Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques f ... more
- Language:
English - Binding: Hardback
- Number of pages: 373
Publisher: Springer-Verlag New York Inc., 2011
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180.75 €
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Book synopsis
Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.
Book details
Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering
180.75 €
- Full title: Microelectronic Test Structures for CMOS Technology
- Author: Manjul Bhushan, Mark B. Ketchen
- Language: English
- Binding: Hardback
- Number of pages: 373
- EAN: 9781441993762
- ISBN: 1441993762
- ID: 01424507
- Publisher: Springer-Verlag New York Inc.
- Weight: 776 g
- Dimensions: 235 × 155 × 27 mm
- Date of publishing: 28. August 2011
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