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Opis

The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

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Kategoria Książki po angielsku Mathematics & science Astronomy, space & time

• Pełny tytuł: Advances in X-Ray Analysis
• Podtytuł: Volume 28
• Autor: Charles S. Barrett, Paul K. Predecki
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 408
• EAN: 9781461294993
• ISBN: 1461294991
• ID: 02174633
• Wydawca: Springer-Verlag New York Inc.
• Waga: 780 g
• Wymiary: 254 × 178 × 23 mm
• Data wydania: 04. October 2011

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