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Opis

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Pełny tytuł: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
• Autor: S. J. B. Reed
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 212
• EAN: 9780521142304
• ISBN: 052114230X
• ID: 04398610
• Wydawca: Cambridge University Press
• Waga: 398 g
• Wymiary: 244 × 172 × 12 mm
• Data wydania: 10. June 2010

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