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Opis

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Szczegóły książki

Kategoria Książki po angielsku Mathematics & science Chemistry Analytical chemistry

• Pełny tytuł: Field Emission Scanning Electron Microscopy
• Autor: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 137
• EAN: 9789811044328
• ISBN: 9811044325
• ID: 16018571
• Wydawca: Springer Verlag, Singapore
• Waga: 252 g
• Wymiary: 159 × 240 × 13 mm
• Data wydania: 06. October 2017

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