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Opis

This volume addresses the issues related to hot-carrier reliability of MOS VLSI circuits, ranging from device physics to circuit design guidelines. It presents a unified view of the physical mechanisms involved in hot-carrier induced device degradation, the prevalent models for these mechanisms, and simulation methods for estimating hot-carrier effects in the circuit environment. The newly emerging approaches to the VLSI design-for-reliability and rule-based reliability diagnosis are also discussed in detail. Hot-Carrier Reliability of MOS VLSI Circuits is primarily for use by engineers and scientists who study device and circuit-level reliability in VLSI systems and develop practical reliability measures and models. VLSI designers will benefit from this book since it offers a comprehensive overview of the interacting mechanisms that influence hot-carrier reliability, and also provides useful guidelines for reliable VLSI design. This volume can be used as an advanced textbook or reference for a graduate-level course on VLSI reliability.

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Pełny tytuł: Hot-Carrier Reliability of MOS VLSI Circuits
• Autor: Yusuf Leblebici, Sung-Mo (Steve) Kang
• Język: Angielski
• Oprawa: Twarda
• Liczba stron: 212
• EAN: 9780792393528
• ISBN: 079239352X
• ID: 01398186
• Wydawca: Springer
• Waga: 1130 g
• Wymiary: 235 × 155 × 15 mm
• Data wydania: 02. June 1993

Ulubione w innej kategorii

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