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Opis

This book covers the state-of-the-art research in design of modern electronic systems used in safety-critical applications such as medical devices, aircraft flight control, and automotive systems. The authors discuss lifetime reliability of digital systems, as well as an overview of the latest research in the field of reliability-aware design of integrated circuits. They address modeling approaches and techniques for evaluation and improvement of lifetime reliability for nano-scale CMOS digital circuits, as well as design algorithms that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.   

Szczegóły książki

Kategoria Książki po angielsku Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Pełny tytuł: Lifetime Reliability-aware Design of Integrated Circuits
• Autor: Mohsen Raji, Behnam Ghavami
• Język: Angielski
• Oprawa: Miękka
• Liczba stron: 107
• EAN: 9783031153471
• ID: 44406367
• Wydawca: Springer, Berlin
• Wymiary: 235 × 155 mm
• Rok wydania: 2023

Ulubione w innej kategorii

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