Kod: 05068958
Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and qua ... więcej
172.38 €
Zwykle: 172.40 €
Oszczędzasz 0.02 €
Wpisz swój adres e-mail, aby otrzymać od nas powiadomienie,
gdy książka będzie dostępna. Proste, prawda?
Za ten zakup dostaniesz 429 punkty
Terrestrial neutron-induced soft errors of semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices. This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.
Kategoria Książki po angielsku Computing & information technology Computer hardware Storage media & peripherals
172.38 €
Osobní odběr Bratislava a 2642 dalších
Copyright ©2008-24 najlacnejsie-knihy.sk Wszelkie prawa zastrzeżonePrywatnieCookies
Nákupní košík ( prázdný )