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Book synopsis

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Book details

Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Full title: Aberration-Corrected Analytical Electron Microscopy
• Author: Rik Brydson
• Language: English
• Binding: Hardback
• Number of pages: 296
• EAN: 9780470518519
• ISBN: 0470518510
• ID: 01388456
• Publisher: John Wiley & Sons Inc
• Weight: 580 g
• Dimensions: 240 × 164 × 20 mm
• Date of publishing: 23. September 2011

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