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Viac informácií o knihe Sample Preparation Handbook for Transmission Electron Microscopy

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Anotácia knihy

This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology.§Key Features of the Handbook:§Combines all of the latest techniques for the preparation of mineral to biological samples §Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level)§Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis §Links to a complementary interactive database website which is available to scientists worldwide §Written by authors with 100 years of combined experience in electron microscopyhttp://temsamprep.in2p3.fr/

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Celý názov: Sample Preparation Handbook for Transmission Electron Microscopy
• Podnázov: Methodology
• Autor: Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 250
• EAN: 9780387981819
• ISBN: 0387981810
• ID: 01385409
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 566 g
• Rozmery: 234 × 165 × 24 mm
• Dátum vydania: 08. July 2010

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