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Book synopsis

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Book details

Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Full title: Scanning Electron Microscopy
• Subtitle: Physics of Image Formation and Microanalysis
• Author: Ludwig Reimer
• Language: English
• Binding: Hardback
• Number of pages: 529
• EAN: 9783540639763
• ISBN: 3540639764
• ID: 01566552
• Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Weight: 954 g
• Dimensions: 166 × 242 × 34 mm
• Date of publishing: 17. September 1998

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