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Viac informácií o knihe Aberration-Corrected Analytical Electron Microscopy

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 158 bodov

Anotácia knihy

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Celý názov: Aberration-Corrected Analytical Electron Microscopy
• Autor: Rik Brydson
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 296
• EAN: 9780470518519
• ISBN: 0470518510
• ID: 01388456
• Nakladateľ: John Wiley & Sons Inc
• Hmotnosť: 580 g
• Rozmery: 240 × 164 × 20 mm
• Dátum vydania: 23. September 2011

Obľúbené z iného súdka

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