Code: 42862496
Advanced Materials Characterization
by Kumar, Ch Sateesh (University of Johannesburg, South Africa), Singh, M. Muralidhar (Madanapalle Institute of Technology & Science, India), Krishna, Ram (MADANAPALLE INSTITUTE OF TECHNOLOGY AND SCIENCE
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffract ... more
- Language:
English - Binding: Hardback
- Number of pages: 191
Publisher: Taylor & Francis Ltd, 2023
- More about this
You might also like
-
Moonwalk
13.95 € -18 % -
The Score
13.65 € -13 % -
The Deal
12.23 € -22 % -
The Mistake
13.44 € -1 % -
Jujutsu Kaisen, Vol. 30
9.90 € -20 % -
Berserk Deluxe Volume 1
35.70 € -25 % -
The Goal
14.56 € -
Berserk Deluxe Volume 2
33.17 € -30 % -
Dancing The Dream
19.92 € -31 % -
Invincible Compendium Volume 2
45.81 € -24 % -
Berserk Deluxe Volume 3
55.22 € -
Legacy
11.93 € -22 % -
Lord of Mysteries, Vol. 3: The Clown, Part III
17.09 € -13 % -
Murdoku
14.05 € -28 % -
White Nights
4.54 € -
Chainsaw Man, Vol. 21
7.68 € -30 % -
Witch Hat Atelier Manga Box Set 1
55.83 € -29 % -
Invincible Compendium Volume 3
46.42 € -23 % -
Jujutsu Kaisen, Vol. 29
9.90 € -20 % -
Jujutsu Kaisen, Vol. 25
9.70 € -25 % -
Witch Hat Atelier: Grimoire Edition 1
35.29 € -29 %
Give this book as a present today
- Order book and choose Gift Order.
- We will send you book gift voucher at once. You can give it out to anyone.
- Book will be send to donee, nothing more to care about.
More about Advanced Materials Characterization
You get 399 loyalty points
Book synopsis
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Book details
165.08 €
- Full title: Advanced Materials Characterization
- Subtitle: Basic Principles, Novel Applications, and Future Directions
- Author: Kumar, Ch Sateesh (University of Johannesburg, South Africa), Singh, M. Muralidhar (Madanapalle Institute of Technology & Science, India), Krishna, Ram (MADANAPALLE INSTITUTE OF TECHNOLOGY AND SCIENCE
- Language: English
- Binding: Hardback
- Number of pages: 191
- EAN: 9781032375106
- ID: 42862496
- Publisher: Taylor & Francis Ltd
- Weight: 346 g
- Dimensions: 234 × 156 mm
- Date of publishing: 05. May 2023
Collection points Bratislava a 12841 dalších
Copyright ©2008-26 najlacnejsie-knihy.sk All rights reservedPrivacyCookies
25686 collection points
Delivery 2.99 €
02/210 210 99 (8-15.30h)