Code: 01427604
Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
by Weronika Walkosz
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applic ... more
- Language:
English - Binding: Paperback
- Number of pages: 110
Publisher: Springer-Verlag New York Inc., 2013
- More about this
122.83 €
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Book synopsis
This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
Book details
Book category Books in English Mathematics & science Chemistry Analytical chemistry
122.83 €
- Full title: Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
- Author: Weronika Walkosz
- Language: English
- Binding: Paperback
- Number of pages: 110
- EAN: 9781461428572
- ISBN: 1461428572
- ID: 01427604
- Publisher: Springer-Verlag New York Inc.
- Weight: 203 g
- Dimensions: 235 × 155 × 8 mm
- Date of publishing: 28. May 2013
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