Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis / Najlacnejšie knihy
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

Code: 01378961

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

by Alvin W. Czanderna, Theodore E. Madey, Cedric J. Powell

Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface ana ... more

168.61 €


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Book synopsis

Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.

Book details

Book category Books in English Mathematics & science Chemistry Physical chemistry

168.61 €

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