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Book synopsis

This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.

Book details

Book category Books in English Technology, engineering, agriculture Electronics & communications engineering

• Full title: Combined Analysis
• Author: Daniel Chateigner
• Language: English
• Binding: Hardback
• Number of pages: 516
• EAN: 9781848211988
• ISBN: 1848211988
• ID: 05103582
• Publisher: ISTE Ltd and John Wiley & Sons Inc
• Weight: 898 g
• Dimensions: 240 × 157 × 34 mm
• Date of publishing: 11. June 2010

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