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Book synopsis

Electromigration is a microscopic phenomenon §involving electric field-induced diffusion, which is §very relevant to damage in interconnections. A §common method for monitoring interconnection §degradation is through electrical resistance §measurements, which requires direct electrical §contact. It is desirable to develop non-contact §methods to monitor electromigration damage §formation. In this thesis, we propose a novel §Optical Microscopy Imaging Method (OMIM), and we §provide a theoretical description and experimental §results. OMIM not only provides a new method for §studying electromigration, but also provides a §useful method for studying other micro-devices and §materials in a non- contact mode.

Book details

Book category Books in English Mathematics & science Physics

• Full title: Electromigration
• Subtitle: Studied with the Optical Microscopy Imaging Method
• Author: Linghong Li
• Language: English
• Binding: Paperback
• Number of pages: 76
• EAN: 9783639088137
• ISBN: 3639088131
• ID: 06817951
• Publisher: VDM Verlag Dr. Mueller E.K.
• Weight: 113 g
• Dimensions: 229 × 152 × 4 mm
• Date of publishing: 10. October 2008

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