Code: 02059930

Materials Reliability Issues in Microelectronics: Volume 225

Name: Materials Reliability Issues in Microelectronics: Volume 225
Brand: Materials Research Society
SKU: 02059930
Price: 35.33 EUR
Availability: BackOrder
Author: James R. LloydFrederick G. YostPaul S. Ho
ISBN: 9781558991194

by James R. LloydFrederick G. YostPaul S. Ho

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Language: English
Binding: Hardback
Number of pages: 382
Publisher: Materials Research Society, 1991
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Book synopsis

With the increased complexity of modern integrated circuits, it is important that reliability problems be attacked properly with the appropriate tools. This volume recognizes that almost all reliability problems are materials problems, and helps to put 'reliabilty physics' on a firm scientific foundation. Topics include: electromigration; stress effects on reliability; stress and packaging; metallization; device, oxide and dielectric reliability; new investigative techniques; corrosion.