Nanometer-scale Defect Detection Using Polarized Light / Najlacnejšie knihy
Nanometer-scale Defect Detection Using Polarized Light

Code: 13595194

Nanometer-scale Defect Detection Using Polarized Light

by Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized ... more

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Book synopsis

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.

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Book category Books in English Technology, engineering, agriculture Mechanical engineering & materials Materials science

159.01 €

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