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Book synopsis

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.

Book details

Book category Books in English Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Full title: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
• Author: Zhong Lin Wang
• Language: English
• Binding: Paperback
• Number of pages: 460
• EAN: 9780521017954
• ISBN: 0521017955
• ID: 02017914
• Publisher: Cambridge University Press
• Weight: 731 g
• Dimensions: 244 × 170 × 25 mm
• Date of publishing: 22. August 2005

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