You might also like

More about Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

• Book details
• Synopsis
• Trending among others

You get 304 loyalty points

Book synopsis

Due to the ever increasing electric fields in scaled CMOS devices, reliability is becoming a showstopper for further scaled technology nodes. Although several groups have already demonstrated functional Si channel devices with aggressively scaled Equivalent Oxide Thickness (EOT) down to 5

Book details

Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
• Author: Jacopo Franco, Ben Kaczer, Guido Groeseneken
• Language: English
• Binding: Hardback
• Number of pages: 187
• EAN: 9789400776623
• ISBN: 9400776624
• ID: 02017347
• Publisher: Springer
• Weight: 483 g
• Dimensions: 235 × 155 × 19 mm
• Date of publishing: 19. October 2013

Trending among others

---

---

---