Code: 04343535
This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation.
English
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Book synopsis
This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation.
Book details
Book category Books in English Technology, engineering, agriculture Other technologies & applied sciences Applied optics
149.99 €
English
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