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Book synopsis

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.

Book details

Book category Books in English Technology, engineering, agriculture Technology: general issues Nanotechnology

• Full title: Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale
• Subtitle: Fundamentals and Applications
• Author: Sergei Kalinin, Alexei Gruverman
• Language: English
• Binding: Hardback
• Number of pages: 1074
• EAN: 9780387286679
• ISBN: 0387286675
• ID: 01381493
• Publisher: Springer, Berlin
• Weight: 1984 g
• Dimensions: 234 × 156 × 31 mm
• Date of publishing: 10. January 2007

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