Code: 04891639

Semiconductor Device & Failure Analysis - Using Photon Emmission Microscopy

Name: Semiconductor Device & Failure Analysis - Using Photon Emmission Microscopy
Brand: John Wiley & Sons Inc
SKU: 04891639
Price: 225.03 EUR
Availability: InStock
Author: Wai-Kin Chim
ISBN: 9780471492405

by Wai-Kin Chim

Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated cir ... more

Language: English
Binding: Hardback
Number of pages: 288
Publisher: John Wiley & Sons Inc, 2000
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Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

225.03 €

Full title: Semiconductor Device & Failure Analysis - Using Photon Emmission Microscopy
Author: Wai-Kin Chim
Language: English
Binding: Hardback
Number of pages: 288
EAN: 9780471492405
ISBN: 047149240X
ID: 04891639
Publisher: John Wiley & Sons Inc
Weight: 716 g
Dimensions: 262 × 176 × 21 mm
Date of publishing: 10. November 2000