Code: 02597387

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Name: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Brand: Springer-Verlag New York Inc.
SKU: 02597387
Price: 128.41 EUR
Availability: BackOrder
Author: Ruijing Shen
ISBN: 9781489987877

by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu

This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks and analog/mixed-signal circuits. It offers an analysis of each algorithm with applications i ... more

Language: English
Binding: Paperback
Number of pages: 306
Publisher: Springer-Verlag New York Inc., 2014
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Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

128.41 €

Full title: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author: Ruijing Shen, Sheldon X.-D. Tan, Hao Yu
Language: English
Binding: Paperback
Number of pages: 306
EAN: 9781489987877
ISBN: 1489987878
ID: 02597387
Publisher: Springer-Verlag New York Inc.
Weight: 516 g
Dimensions: 17 × 155 × 18 mm
Date of publishing: 13. April 2014