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Book synopsis

1. Theoretical Aspects 2. Instrumentation 3. Using Optical Parameters to Determine Material Properties 4. Determining Optical Parameters for Inaccessible Substrates and Unknown Films 5. Extremely Thin Films 6. The Special Case of Polysilicon 7. The Effect of Roughness Case Studies Case 1. Dissolution and Swelling of Thin Polymer Films Case 2. Ion Beam Interaction with Silicon Case 3. Dry Oxidation of Metals Case 4. Optical Properties of Sputtered Chromium Suboxide Thin Films Case 5. Ion-assisted Film Growth of Zirconium Dioxide Case 6. Electrochemical/Ellipsometric Studies of Oxides on Metals Case 7. Amorphous Hydrogenated Carbon Films Case 8. Fluoropolymer Films on Silicon from Reactive Ion Etching Case 9. Various Films on InP Case 10. Benzotriazole and Benzimidazole on Copper Case 11. Gas Adsorption on Metal Surfaces Case 12. Silicon-Germanium Thin Films Case 13. Profiling of HgCdTe Case 14. Oxides and Nitrides of Silicon Appendices

Book details

Book category Books in English Mathematics & science Physics Nuclear physics

• Full title: User's Guide to Ellipsometry
• Author: Harland G Tompkins
• Language: English
• Binding: Paperback
• Number of pages: 272
• EAN: 9780486450285
• ISBN: 0486450287
• ID: 01290865
• Publisher: Dover Publications Inc.
• Weight: 300 g
• Dimensions: 214 × 137 × 15 mm
• Date of publishing: 07. July 2006

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