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Book synopsis

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.

Book details

Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Full title: Atom Probe Field Ion Microscopy
• Author: M.K. Miller, A. Cerezo, M.G. Hetherington, G.D.W. Smith
• Language: English
• Binding: Hardback
• Number of pages: 520
• EAN: 9780198513872
• ISBN: 0198513879
• ID: 04527017
• Publisher: Oxford University Press
• Weight: 1042 g
• Dimensions: 242 × 164 × 33 mm
• Date of publishing: 19. September 1996

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