Atomic Force Microscopy in Adhesion Studies / Najlacnejšie knihy
Atomic Force Microscopy in Adhesion Studies

Code: 06671236

Atomic Force Microscopy in Adhesion Studies

by Kash L Mittal

Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on ... more

472.06

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Book synopsis

Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on AFM techniques.

Book details

Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques

472.06

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