Code: 06671236
Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on ... more
English
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Book synopsis
Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on AFM techniques.
Book details
Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques
472.06 €
English
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