Code: 06671236
Atomic Force Microscopy in Adhesion Studies
by Kash L Mittal
Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on ... more
- Language:
English - Binding: Hardback
- Number of pages: 822
Publisher: Brill, 2005
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477.76 €
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Book synopsis
Atomic Force Microscopy (AFM) measures the forces between a tip and the substrate and maps the substrate surface topography and properties based on the measurement of tip-substrate interactions. This volume contains the papers on AFM techniques.
Book details
Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques
477.76 €
- Full title: Atomic Force Microscopy in Adhesion Studies
- Author: Kash L Mittal
- Language: English
- Binding: Hardback
- Number of pages: 822
- EAN: 9789067644341
- ISBN: 9789067644341
- ID: 06671236
- Publisher: Brill
- Weight: 1680 g
- Dimensions: 234 × 156 mm
- Date of publishing: 01. October 2005
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