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Viac informácií o knihe CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 561 bodov

Anotácia knihy

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Parametre knihy

Zaradenie knihy Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
• Podnázov: Process-Aware SRAM Design and Test
• Autor: Andrei Pavlov, Manoj Sachdev
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 194
• EAN: 9781402083624
• ISBN: 1402083629
• ID: 01418343
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 468 g
• Rozmery: 239 × 166 × 19 mm
• Dátum vydania: 01. May 2008

Obľúbené z iného súdka

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