Code: 01418343

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Name: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Brand: Springer-Verlag New York Inc.
SKU: 01418343
Price: 226.53 EUR
Availability: InStock

by Andrei Pavlov, Manoj Sachdev

Language: English
Binding: Hardback
Number of pages: 194
Publisher: Springer-Verlag New York Inc., 2008
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Book synopsis

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Book details

Book category Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

226.53 €

Full title: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Subtitle: Process-Aware SRAM Design and Test
Author: Andrei Pavlov, Manoj Sachdev
Language: English
Binding: Hardback
Number of pages: 194
EAN: 9781402083624
ISBN: 1402083629
ID: 01418343
Publisher: Springer-Verlag New York Inc.
Weight: 468 g
Dimensions: 239 × 166 × 19 mm
Date of publishing: 01. May 2008