Code: 01424651
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-base ... more
English
100.93 €
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Book synopsis
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
Book details
Book category Books in English Technology, engineering, agriculture Electronics & communications engineering Electronics engineering
100.93 €
English
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