Atomic Force Microscopy/Scanning Tunneling Microscopy 3 / Najlacnejšie knihy
Atomic Force Microscopy/Scanning Tunneling Microscopy 3

Code: 01379186

Atomic Force Microscopy/Scanning Tunneling Microscopy 3

by Samuel H. Cohen, Marcia L. Lightbody

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, ... more

167.81


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Book synopsis

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Book details

Book category Books in English Mathematics & science Science: general issues Scientific equipment, experiments & techniques

167.81

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