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Viac informácií o knihe Advances in Imaging and Electron Physics

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• Anotácia kniha
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Anotácia knihy

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics" and "Electron Physics and Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This title features contributions from leading international scholars and industry experts. It discusses hot topic areas and presents current and future research trends. It is an invaluable reference and guide for physicists, engineers and mathematicians.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Other technologies & applied sciences Applied optics

• Celý názov: Advances in Imaging and Electron Physics
• Podnázov: Optics of Charged Particle Analyzers
• Autor: Peter W. Hawkes
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 296
• EAN: 9780123813169
• ISBN: 0123813166
• ID: 04494501
• Nakladateľ: Elsevier Science Publishing Co Inc
• Hmotnosť: 530 g
• Rozmery: 229 × 152 × 20 mm
• Dátum vydania: 30. June 2010

Obľúbené z iného súdka

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