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Viac informácií o knihe Applied Scanning Probe Methods I

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Anotácia knihy

This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques willbenefit from the international perspective assembled in the book.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Celý názov: Applied Scanning Probe Methods I
• Autor: Bharat Bhushan, Harald Fuchs, Sumio Hosaka
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 476
• EAN: 9783540005278
• ISBN: 3540005277
• ID: 01556158
• Nakladateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnosť: 1002 g
• Rozmery: 235 × 155 × 35 mm
• Dátum vydania: 13. January 2004

Obľúbené z iného súdka

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