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Viac informácií o knihe Atomic Force Microscopy/Scanning Tunneling Microscopy 3

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

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Anotácia knihy

This proceedings is based on the third Atomic Force Microscopy/Scanning Tunneling Microscopy symposium. The purpose of the meeting was to provide an interface between scientists, engineers, representatives of industry, government, and academia, all of whom have a common interest in probe microscopies. The papers have been written by experts in probe microscopy from around the world, representing a wide range of disciplines, including physics, biotechnology, nanotechnology, chemistry, and materials science.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Celý názov: Atomic Force Microscopy/Scanning Tunneling Microscopy 3
• Autor: Samuel H. Cohen, Marcia L. Lightbody
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 210
• EAN: 9780306462979
• ISBN: 0306462974
• ID: 01379186
• Nakladateľ: Springer Science+Business Media
• Hmotnosť: 635 g
• Rozmery: 254 × 178 × 20 mm
• Dátum vydania: 31. December 1999

Obľúbené z iného súdka

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