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More about CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

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Book synopsis

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

Book details

Book category Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
• Subtitle: Process-Aware SRAM Design and Test
• Author: Andrei Pavlov, Manoj Sachdev
• Language: English
• Binding: Paperback
• Number of pages: 194
• EAN: 9789048178551
• ISBN: 904817855X
• ID: 01975971
• Publisher: Springer
• Weight: 332 g
• Dimensions: 235 × 155 × 12 mm
• Date of publishing: 28. October 2010

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