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Book synopsis

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Book details

Book category Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: CMOS Test and Evaluation
• Subtitle: A Physical Perspective
• Author: Manjul Bhushan, Mark B. Ketchen
• Language: English
• Binding: Paperback
• Number of pages: 424
• EAN: 9781493947027
• ISBN: 1493947028
• ID: 14203439
• Publisher: Springer-Verlag New York Inc.
• Weight: 6613 g
• Dimensions: 235 × 155 × 23 mm
• Date of publishing: 10. September 2016

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