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Viac informácií o knihe CMOS Test and Evaluation

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 317 bodov

Anotácia knihy

CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: CMOS Test and Evaluation
• Podnázov: A Physical Perspective
• Autor: Manjul Bhushan, Mark B. Ketchen
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 424
• EAN: 9781493947027
• ISBN: 1493947028
• ID: 14203439
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 6613 g
• Rozmery: 235 × 155 × 23 mm
• Dátum vydania: 10. September 2016

Obľúbené z iného súdka

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