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Viac informácií o knihe Defect Recognition and Image Processing in Semiconductors 1997

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 1731 bodov

Anotácia knihy

Presents an overview of techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This book addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. It investigates defects in layers and devices.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Defect Recognition and Image Processing in Semiconductors 1997
• Podnázov: Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, September 1997
• Autor: I. Rechenberg
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 524
• EAN: 9780750305006
• ISBN: 9780750305006
• ID: 06681091
• Nakladateľ: Taylor & Francis Ltd
• Hmotnosť: 1170 g
• Rozmery: 234 × 156 × 30 mm
• Dátum vydania: 01. January 1998

Obľúbené z iného súdka

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