Kód: 01424651
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-base ... celý popis
Angličtina
100.93 €
Bežne: 111.80 €
Ušetríte 10.87 €

Nákupom získate 244 bodov
Anotácia knihy
This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.
Parametre knihy
Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering
100.93 €
Angličtina
Osobný odber Bratislava a 13292 dalších
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