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Viac informácií o knihe Impact of Electron and Scanning Probe Microscopy on Materials Research

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 345 bodov

Anotácia knihy

This book presents a coherent synopsis of a rapidly evolving field. Subjects covered include diffraction contrast and defect analysis by conventional TEM lattice imaging, phase contrast and resolution limits in high resolution electron microscopy. Specialised electron diffraction techniques are also covered, as is the application of parallel electron energy loss spectroscopy and scanning transmission EM for subnanometer analysis. Materials analyzed include thin films, interfaces and non-conventional materials. WDS and EDS are treated, with an emphasis on phi(rhoZeta) techniques for the analysis of thin layers and surface films. Theoretical and practical aspects of ESEM are discussed in relation to applications in crystal growth, biomaterials and polymers. Recent developments in SPM are also described. §A comprehensive survey of the state of the art in electron and SPM, future research directions and prospective applications in materials engineering.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Celý názov: Impact of Electron and Scanning Probe Microscopy on Materials Research
• Autor: David G. Rickerby, Giovanni Valdr, Ugo Valdr
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 489
• EAN: 9780792359395
• ISBN: 0792359399
• ID: 01396168
• Nakladateľ: Springer
• Hmotnosť: 1980 g
• Rozmery: 244 × 170 × 33 mm
• Dátum vydania: 01. October 1999

Obľúbené z iného súdka

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