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Viac informácií o knihe IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales

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Anotácia knihy

This volume is a collection of twenty five written contributions by distinguished invited speakers from seven countries to the IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-scales. Size effects on material and structural behaviors are of great interest to physicists, material scientists, and engineers who need to understand and model the mechanical behavior of solids especially at micron- and nano-scales.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Celý názov: IUTAM Symposium on Size Effects on Material and Structural Behavior at Micron- and Nano-Scales
• Podnázov: Proceedings of the IUTAM Symposium held in Hong Kong, China, 31 May - 4 June, 2004
• Autor: Q. P. Sun, P. Tong
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 272
• EAN: 9781402049453
• ISBN: 1402049455
• ID: 01416785
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 1320 g
• Rozmery: 297 × 210 × 20 mm
• Dátum vydania: 10. August 2006

Obľúbené z iného súdka

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