You might also like

More about Low-Voltage SOI CMOS VLSI Devices and Circuits

• Book details
• Synopsis
• Trending among others

You get 551 loyalty points

Book synopsis

A practical, comprehensive survey of SOI CMOS devices and circuits for microelectronics engineers The microelectronics industry is becoming increasingly dependent on SOI CMOS VLSI devices and circuits. This book is the first to address this important topic with a practical focus on devices and circuits. It provides an up-to-date survey of the current knowledge regarding SOI device behaviors and describes state-of-the-art low-voltage CMOS VLSI analog and digital circuit techniques. Low-Voltage SOI CMOS VLSI Devices and Circuits covers the entire field, from basic concepts to the most advanced ideas. Topics include: SOI device behavior: fundamental and floating body effects, hot carrier effects, sensitivity, reliability, self-heating, breakdown, ESD, dual-gate devices, accumulation-mode devices, short channel effects, and narrow channel effects Low-voltage SOI digital circuits: floating body effects, DRAM, SRAM, static logic, dynamic logic, gate array, CPU, frequency divider, and DSP Low-voltage SOI analog circuits: op amps, filters, ADC/DAC, sigma-delta modulators, RF circuits, VCO, mixers, low-noise amplifiers, and high-temperature circuits With over 300 references to the state of the art and over 300 important figures on low-voltage SOI CMOS devices and circuits, this volume serves as an authoritative, reliable resource for engineers designing these circuits in high-tech industries.

Book details

Book category Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: Low-Voltage SOI CMOS VLSI Devices and Circuits
• Author: James B. Kuo, Shih-Chia Lin
• Language: English
• Binding: Hardback
• Number of pages: 424
• EAN: 9780471417774
• ISBN: 0471417777
• ID: 04890737
• Publisher: John Wiley & Sons Inc
• Weight: 746 g
• Dimensions: 241 × 170 × 29 mm
• Date of publishing: 05. October 2001

---

---

---