Kód: 05357937
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance o ... celý popis
Angličtina
Nákupom získate 376 bodov
Anotácia knihy
A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi
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Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering
155.41 €
Angličtina
Osobný odber Bratislava a 12820 dalších
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