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Viac informácií o knihe Multi-Chip Module Test Strategies

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Anotácia knihy

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. §Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. §Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). §

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Celý názov: Multi-Chip Module Test Strategies
• Autor: Yervant Zorian
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 167
• EAN: 9781461377986
• ISBN: 9781461377986
• ID: 06623159
• Nakladateľ: Springer-Verlag New York Inc.
• Hmotnosť: 369 g
• Rozmery: 260 × 195 × 10 mm
• Dátum vydania: 04. October 2012

Obľúbené z iného súdka

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