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Book synopsis

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations.

Book details

Book category Knihy po anglicky Technology, engineering, agriculture Electronics & communications engineering Electronics engineering

• Full title: Multi-run Memory Tests for Pattern Sensitive Faults
• Author: Ireneusz Mrozek
• Language: English
• Binding: Hardback
• Number of pages: 135
• EAN: 9783319912035
• ISBN: 3319912038
• ID: 19315838
• Publisher: Springer International Publishing AG
• Weight: 395 g
• Dimensions: 235 × 155 × 15 mm
• Date of publishing: 18. July 2018

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