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Viac informácií o knihe Noncontact Atomic Force Microscopy

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 778 bodov

Anotácia knihy

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Chemistry Analytical chemistry

• Celý názov: Noncontact Atomic Force Microscopy
• Podnázov: Volume 2
• Autor: Seizo Morita, Roland Wiesendanger, Franz J. Giessibl
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 401
• EAN: 9783642014949
• ISBN: 3642014941
• ID: 01649678
• Nakladateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnosť: 870 g
• Rozmery: 235 × 155 × 30 mm
• Dátum vydania: 12. August 2009

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