Mohlo by sa vám tiež páčiť

Viac informácií o knihe Noncontact Atomic Force Microscopy

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 498 bodov

Anotácia knihy

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Scientific equipment, experiments & techniques

• Celý názov: Noncontact Atomic Force Microscopy
• Autor: Seizo Morita, Roland Wiesendanger, Ernst Meyer
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 440
• EAN: 9783540431176
• ISBN: 3540431179
• ID: 01564043
• Nakladateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnosť: 912 g
• Rozmery: 241 × 164 × 35 mm
• Dátum vydania: 24. July 2002

Obľúbené z iného súdka

---

---

---