Mohlo by sa vám tiež páčiť

Viac informácií o knihe Positron Profilometry

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 110 bodov

Anotácia knihy

This book provides a comprehensive overview of positron profilometry, specifically focusing on the analysis of defect depth distribution in materials. Positron profilometry plays a crucial role in understanding and characterizing defects in a wide range of materials, including metals, semiconductors, polymers, and ceramics. By analyzing the depth distribution of defects, researchers can gain insights into various material properties, such as crystal structure, defect density, and diffusion behavior. The author's extensive research spanning a period of two decades has primarily centered on subsurface zones. These regions, located beneath the surface and subjected to various surface processes, play a crucial role in generating defect distributions. Three experimental techniques and their data analysis are described in detail: a variable-energy positron beam (VEP) called sometimes a slow positron beam, a technique called implantation profile depth scanning (DSIP), and a sequential etching (SET) technique. The usability of these techniques is illustrated by many examples of measurements by the author and others.

Parametre knihy

Zaradenie knihy Knihy po anglicky Technology, engineering, agriculture Mechanical engineering & materials Materials science

• Celý názov: Positron Profilometry
• Podnázov: Probing Material Depths for Enhanced Understanding
• Autor: Jerzy Dryzek
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 152
• EAN: 9783031410925
• ID: 43748855
• Nakladateľ: Springer, Berlin
• Hmotnosť: 272 g
• Rozmery: 235 × 155 mm
• Dátum vydania: 09. September 2023

Obľúbené z iného súdka

---

---

---