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Viac informácií o knihe Sampling, Wavelets, and Tomography

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

Nákupom získate 249 bodov

Anotácia knihy

Sampling, wavelets, and tomography are three active areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. The advent of new techniques in mathematical analysis has strengthened their interdependence and led to some new and interesting results in the field. This state-of-the-art book not only presents new results in these research areas, but it also demonstrates the role of sampling in both wavelet theory and tomography. Aimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, the work is designed to be accessible to an audience with diverse mathematical backgrounds. Although the volume reflects the contributions of renowned mathematicians and engineers, each chapter has an expository introduction writtenfor the non-specialist. One of the key features of the book is an introductory chapter stressing the interdependence of the three main areas covered.

Parametre knihy

Zaradenie knihy Knihy po anglicky Mathematics & science Science: general issues Maths for scientists

• Celý názov: Sampling, Wavelets, and Tomography
• Autor: John J. Benedetto, Ahmed I. Zayed
• Jazyk: Angličtina
• Väzba: Pevná
• Počet strán: 344
• EAN: 9780817643041
• ISBN: 0817643044
• ID: 01399348
• Nakladateľ: Birkhauser Boston Inc
• Hmotnosť: 1540 g
• Rozmery: 235 × 155 × 25 mm
• Dátum vydania: 10. December 2003

Obľúbené z iného súdka

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