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Viac informácií o knihe Structural, Syntactic, and Statistical Pattern Recognition

• Parametre knihy
• Anotácia kniha
• Obľúbené z iného súdka

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Anotácia knihy

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

Parametre knihy

Zaradenie knihy Knihy po anglicky Computing & information technology Computer science Artificial intelligence

• Celý názov: Structural, Syntactic, and Statistical Pattern Recognition
• Podnázov: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
• Autor: Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli
• Jazyk: Angličtina
• Väzba: Brožovaná
• Počet strán: 939
• EAN: 9783540372363
• ISBN: 3540372369
• ID: 01562456
• Nakladateľ: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
• Hmotnosť: 1431 g
• Rozmery: 235 × 155 × 50 mm
• Dátum vydania: 03. August 2006

Obľúbené z iného súdka

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